Library | LabRulez ICPMS

Quantitative Analysis of Amount of Deposition and Plating Thickness: Multilayer and Irregular Shaped Sample

Applications

| 2021 | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

Quantitative analysis of tint in polymer pellets and disks

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

X-ray Fluorescence Analysis of Lead in Tin Plating Using Theoretical Intensity of Scattered X-rays - Analysis of RoHS Regulated Elements by Energy Dispersive X-ray Fluorescence Spectrometer (EDX)

Applications

| N/A | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

The fluorescent properties of a stalactite sample using the Agilent Cary Eclipse fiber-optic probe accessory

Applications

| 2011 | Agilent Technologies

Fluorescence spectroscopy

Instrumentation

Fluorescence spectroscopy

Manufacturer

Agilent Technologies

Industries

Quantitative Analysis of Elements in Small Quantity of Organic Matter by EDXRF - New Feature of Background FP Method

Applications

| 2013 | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Energy & Chemicals

WCPS: Fundamental Studies of a Nitrogen Microwave Plasma for Analytical Emission Spectroscopy

Posters

| 2017 | Agilent Technologies

MP/ICP-AES

Instrumentation

MP/ICP-AES

Manufacturer

Agilent Technologies

Industries

Agilent Cary 7000 universal measurement spectrophotometer

Brochures and specifications

| 2022 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

EDXRF Analysis of Cd and Pb

Applications

| N/A | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

The Benefits of Raman Spectroscopy for the Identification and Characterization of Polymers

Technical notes

| N/A | Metrohm

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Metrohm

Industries

Energy & Chemicals

Fluorescence-free 785 nm material identification with MIRA XTR DS

Technical notes

| 2021 | Metrohm

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Metrohm

Industries

Homeland Security

Quantitative Analysis of Amount of Deposition and Plating Thickness: Multilayer and Irregular Shaped Sample

Quantitative analysis of tint in polymer pellets and disks

X-ray Fluorescence Analysis of Lead in Tin Plating Using Theoretical Intensity of Scattered X-rays - Analysis of RoHS Regulated Elements by Energy Dispersive X-ray Fluorescence Spectrometer (EDX)

The fluorescent properties of a stalactite sample using the Agilent Cary Eclipse fiber-optic probe accessory

Quantitative Analysis of Elements in Small Quantity of Organic Matter by EDXRF - New Feature of Background FP Method

WCPS: Fundamental Studies of a Nitrogen Microwave Plasma for Analytical Emission Spectroscopy

Agilent Cary 7000 universal measurement spectrophotometer

EDXRF Analysis of Cd and Pb

The Benefits of Raman Spectroscopy for the Identification and Characterization of Polymers

Fluorescence-free 785 nm material identification with MIRA XTR DS

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