The Influence of Modulation Period Changes on Slightly Resolved Components Using Variable Modulation in GCxGC
Posters
| 2012 | LECO (Pittcon)
GCxGC, GC/MSD, GC/TOF
Instrumentation
GCxGC, GC/MSD, GC/TOF
Manufacturer
LECO
Industries
The Influence of Modulation Period Changes on Slightly Resolved Components Using Variable Modulation in GCxGC
Posters
| 2012 | LECO
GCxGC, GC/MSD, GC/TOF
Instrumentation
GCxGC, GC/MSD, GC/TOF
Manufacturer
LECO
Industries
Recommendations for Hemp Testing: Laboratory Compliance
Technical notes
| 2021 | Agilent Technologies
Software
Instrumentation
Software
Manufacturer
Agilent Technologies
Industries
Food & Agriculture
Recommendations for Cannabis Testing: Laboratory Compliance
Technical notes
| 2021 | Agilent Technologies
Software
Instrumentation
Software
Manufacturer
Agilent Technologies
Industries
Food & Agriculture
Enhanced Results of Diesel Range Organics Analysis with High Temperature Zebron™ Inferno™ GC Columns
Applications
| 2012 | Phenomenex
GC, GC columns, Consumables
Instrumentation
GC, GC columns, Consumables
Manufacturer
Phenomenex
Industries
Environmental
Enhanced Results of Diesel Range Organics Analysis with High Temperature Zebron™ Inferno™ GC Columns
Applications
| 2012 | Phenomenex
GC, GC columns, Consumables
Instrumentation
GC, GC columns, Consumables
Manufacturer
Agilent Technologies, Phenomenex
Industries
Energy & Chemicals
Does Informatics System Reliability Keep You Awake at Night?
Others
| 2024 | Agilent Technologies
Software
Instrumentation
Software
Manufacturer
Agilent Technologies
Industries
Others
Theory and Key Principles Series: Session 8 – Maintenance & Troubleshooting
Presentations
| 2020 | Shimadzu
GC
Instrumentation
GC
Manufacturer
Shimadzu
Industries
The Comparison of HS-SPME and SPME Arrow Sampling Techniques Utilized to Characterize Volatiles in the Headspace of Wine over an Extended Period of Time
Applications
| 2017 | Shimadzu (Pittcon)
GC/MSD, SPME, GC/SQ
Instrumentation
GC/MSD, SPME, GC/SQ
Manufacturer
Shimadzu
Industries
Food & Agriculture
A Basic Overview: Meeting the PIC/S Requirements for a Computerized System