Library | LabRulez ICPMS

Trace level analysis of sulfur, phosphorus, silicon and chlorine in NMP using the Agilent 8800 Triple Quadrupole ICP-MS

Applications

| 2013 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Pharma & Biopharma

Robust and sensitive determination of multi-elements in N-methyl-2-pyrrolidone (NMP) using ICP-OES

Applications

| 2023 | Thermo Fisher Scientific

ICP/OES

Instrumentation

ICP/OES

Manufacturer

Thermo Fisher Scientific

Industries

Energy & Chemicals

Elemental and Particle Analysis of N-Methyl-2-Pyrrolidone (NMP) by ICP-MS/MS

Applications

| 2022 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

WCPS: Particle Analysis of Two High Purity Grades of N-Methyl-2- Pyrrolidone (NMP) using Single Particle (sp)ICP-MS/MS Method

Posters

| 2023 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Semiconductor Analysis

Trace Analysis of Palladium Using Electrothermal Atomization

Applications

| N/A | Shimadzu

AAS

Instrumentation

AAS

Manufacturer

Shimadzu

Industries

Agilent ICP-MS Journal (November 2022, Issue 90)

Others

| 2022 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Pharma & Biopharma, Semiconductor Analysis

Analytical Solutions for Analysis of Polymer Additives

Guides

| 2022 | Shimadzu

GC/MSD, Pyrolysis, GC/SQ, MALDI, LC/TOF, LC/HRMS, LC/MS, LC/MS/MS, LC/QQQ, DART, GPC/SEC, NIR Spectroscopy

Instrumentation

GC/MSD, Pyrolysis, GC/SQ, MALDI, LC/TOF, LC/HRMS, LC/MS, LC/MS/MS, LC/QQQ, DART, GPC/SEC, NIR Spectroscopy

Manufacturer

Shimadzu

Industries

Energy & Chemicals

CFRP Analysis, Testing and Inspection Evaluation Instruments

Brochures and specifications

| 2015 | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

Measuring Inorganic Impurities in Semiconductor Manufacturing

Guides

| 2022 | Agilent Technologies

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Instrumentation

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Technical Overview and Performance Capability of the Agilent 7900s ICP-MS for Semiconductor Applications

Technical notes

| 2020 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Trace level analysis of sulfur, phosphorus, silicon and chlorine in NMP using the Agilent 8800 Triple Quadrupole ICP-MS

Robust and sensitive determination of multi-elements in N-methyl-2-pyrrolidone (NMP) using ICP-OES

Elemental and Particle Analysis of N-Methyl-2-Pyrrolidone (NMP) by ICP-MS/MS

WCPS: Particle Analysis of Two High Purity Grades of N-Methyl-2- Pyrrolidone (NMP) using Single Particle (sp)ICP-MS/MS Method

Trace Analysis of Palladium Using Electrothermal Atomization

Agilent ICP-MS Journal (November 2022, Issue 90)

Analytical Solutions for Analysis of Polymer Additives

CFRP Analysis, Testing and Inspection Evaluation Instruments

Measuring Inorganic Impurities in Semiconductor Manufacturing

Technical Overview and Performance Capability of the Agilent 7900s ICP-MS for Semiconductor Applications

Related content

Scientists continue to push the boundaries of imaging techniques and reveal the mysterious world of molecules

Preventing early-onset colorectal cancers aim of $25 million award

New Research Reveals Pesticide Mixtures Widespread in Environment, Urging Enhanced Regulatory Measures