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    Low reflectance measurements using the ‘VW’ technique

    Technical notes
    | 2011 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries

    Shimadzu FTIR talk letter Vol. 30

    Others
    | 2019 | Shimadzu
    FTIR Spectroscopy, X-ray
    Instrumentation
    FTIR Spectroscopy, X-ray
    Manufacturer
    Shimadzu
    Industries
    Materials Testing

    Shimadzu FTIR talk letter vol. 36

    Others
    | 2021 | Shimadzu
    FTIR Spectroscopy, Microscopy
    Instrumentation
    FTIR Spectroscopy, Microscopy
    Manufacturer
    Shimadzu
    Industries
    Energy & Chemicals , Materials Testing

    Shimadzu FTIR talk letter Vol. 37

    Others
    | 2021 | Shimadzu
    FTIR Spectroscopy
    Instrumentation
    FTIR Spectroscopy
    Manufacturer
    Shimadzu
    Industries
    Energy & Chemicals , Materials Testing

    FTIR talk letter vol. 17

    Others
    | 2012 | Shimadzu
    FTIR Spectroscopy
    Instrumentation
    FTIR Spectroscopy
    Manufacturer
    Shimadzu
    Industries
    Energy & Chemicals

    Agilent 8700 LDIR Chemical Imaging System

    Brochures and specifications
    | 2019 | Agilent Technologies
    FTIR Spectroscopy
    Instrumentation
    FTIR Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries

    FTIR Talk letter vol. 9

    Others
    | 2007 | Shimadzu
    NIR Spectroscopy, FTIR Spectroscopy
    Instrumentation
    NIR Spectroscopy, FTIR Spectroscopy
    Manufacturer
    Shimadzu
    Industries

    Optical Characterization of Thin Films

    Applications
    | 2022 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Near-infrared spectroscopy: Comparison of techniques

    Technical notes
    | 2017 | Metrohm
    NIR Spectroscopy
    Instrumentation
    NIR Spectroscopy
    Manufacturer
    Metrohm
    Industries
    Materials Testing

    HIGH RESOLUTION MULTI-REFLECTING TIME-OF-FLIGHT MASS ANALYZER WITH FOLDED FLIGHT PATH

    Technical notes
    | 2021 | LECO
    GC/MSD, GC/HRMS, GC/TOF
    Instrumentation
    GC/MSD, GC/HRMS, GC/TOF
    Manufacturer
    LECO
    Industries
     

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