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    ACS: Best practices to simplify environmental sample analysis by ICP-MS

    Presentations
    | 2022 | Thermo Fisher Scientific
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Thermo Fisher Scientific, Elemental Scientific
    Industries
    Environmental

    Agilent ICP-MS Journal (February 2023, Issue 91)

    Others
    | 2023 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Food & Agriculture, Energy & Chemicals

    Elemental and isotopic analysis: solutions for food authenticity, quality and safety

    Presentations
    | 2022 | Thermo Fisher Scientific (RAFA)
    GC/MSD, GC/HRMS, ICP/MS, ICP/MS/MS
    Instrumentation
    GC/MSD, GC/HRMS, ICP/MS, ICP/MS/MS
    Manufacturer
    Thermo Fisher Scientific
    Industries
    Food & Agriculture

    A New Design of Ion Lens and Collision/Reaction Cell for ICP-MS

    Posters
    | N/A | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries

    IMSC: A New Design of Ion Lens and Collision/Reaction Cell for ICP-MS

    Posters
    | 2009 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries

    ORS4 AND HELIUM MODE FOR MORE EFFECTIVE INTERFERENCE REMOVAL IN COMPLEX SAMPLES

    Others
    | 2015 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries

    Mnova Binding (Starting Guide)

    Manuals
    | 2022 | Mestrelab Research
    NMR, Software
    Instrumentation
    NMR, Software
    Manufacturer
    Mestrelab Research
    Industries
    Others

    WCPS: Analysis of Metal Impurities in Pharmaceutical Ingredients in Preparation for the New USP Methods

    Posters
    | 2011 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Pharma & Biopharma

    WCPS: Ultratrace Analysis of Phosphorus, Boron and Other Impurities in Photovoltaic Silicon and Trichlorosilane by ICP-MS with High Energy Collision Cell

    Posters
    | 2011 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    WCPS: Trace Level Analysis of V, As and Se Using He Cell Gas via Kinetic Energy Discrimination and Collisional Dissociation in Acidic Matrices

    Posters
    | 2010 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
     

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