Cary Eclipse Fluorescence spectrophotometer – Site Preparation Checklist
Manuals
| 2012 | Agilent Technologies
Fluorescence spectroscopy
Instrumentation
Fluorescence spectroscopy
Manufacturer
Agilent Technologies
Industries
Agilent ICP-MS Journal (July 2020, Issue 81)
Others
| 2020 | Agilent Technologies
ICP/MS, ICP/MS/MS, Laser ablation
Instrumentation
ICP/MS, ICP/MS/MS, Laser ablation
Manufacturer
Agilent Technologies
Industries
Environmental
Monitoring Heavy Metals by ICP- OES for Compliance with RoHS and WEEE Directives
Applications
| 2010 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
Materials Testing
Determination of additives in polymer pellets by near-infrared spectroscopy
Applications
| N/A | Metrohm
NIR Spectroscopy
Instrumentation
NIR Spectroscopy
Manufacturer
Metrohm
Industries
Materials Testing
Plasma Robustness and Matrix Tolerance
Technical notes
| 2020 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Laser Ablation (LA) ICP-MS Fundamentals
Technical notes
| 2022 | Agilent Technologies
ICP/MS, Laser ablation
Instrumentation
ICP/MS, Laser ablation
Manufacturer
Agilent Technologies
Industries
Elemental Analysis of Pure Metals and Alloys by Femtosecond Laser Ablation (LA-)ICP-MS
Applications
| 2022 | Agilent Technologies
ICP/MS, ICP/MS/MS, Laser ablation
Instrumentation
ICP/MS, ICP/MS/MS, Laser ablation
Manufacturer
Agilent Technologies
Industries
Materials Testing
Raman Spectroscopy as a Tool for Process Analytical Technology
Technical notes
| 2017 | Metrohm
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Metrohm
Industries
Energy & Chemicals , Pharma & Biopharma
Determination of Magnesium, Calcium and Potassium in Brines by Flame AAS using the SIPS-10 Accessory for Automated Calibration and On-Line Sample Dilution
Applications
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Fast Analysis of Water Samples Comparing Axially-and Radially- Viewed CCD Simultaneous ICP-OES