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Publication Date
Measurement of Degree of Crystallinity of Cellulose Nanofiber
Applications
| 2018 | Shimadzu
XRD
Instrumentation
XRD
Manufacturer
Shimadzu
Industries
Materials Testing
Investigating the Angular Dependence of Absolute Specular Reflection
Applications
| 2022 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Purity, degree of substitution (DS), and moisture content of carboxymethyl cellulose (CMC)
Applications
| N/A | Metrohm
NIR Spectroscopy
Instrumentation
NIR Spectroscopy
Manufacturer
Metrohm
Industries
Energy & Chemicals
10 and 45 Degree Specular Reflectance Accessories for the Agilent Cary 630 FTIR
Others
| 2022 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Obtaining Optimum Performance When Using the SIPS Accessory
Technical notes
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Ultratrace Tin Speciation with GC-ICP-MS using the Thermo Scientific GCI 100 Interface
Applications
| 2016 | Thermo Fischer Scientific
GC, ICP/MS, Speciation analysis
Instrumentation
GC, ICP/MS, Speciation analysis
Manufacturer
Thermo Fischer Scientific
Industries
Environmental
Characterizing Sub-Nanometer Narrow Bandpass Filters Using an Agilent Cary UV-Vis-NIR
Applications
| 2023 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Measuring the reflective properties of architectural glass using the Agilent Cary 630 FTIR with 10 degree Specular Refl ectance Accessory
Applications
| 2013 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing
AGILENT SPS 4 AUTOSAMPLER
Brochures and specifications
| 2016 | Agilent Technologies
ICP/MS, ICP/OES, AAS, ICP/MS/MS, MP/ICP-AES
Instrumentation
ICP/MS, ICP/OES, AAS, ICP/MS/MS, MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements
Applications
| 2020 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
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