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Measurement of Degree of Crystallinity of Cellulose Nanofiber
Applications
| 2018 | Shimadzu
XRD
Instrumentation
XRD
Manufacturer
Shimadzu
Industries
Materials Testing
Investigating the Angular Dependence of Absolute Specular Reflection
Applications
| 2022 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Purity, degree of substitution (DS), and moisture content of carboxymethyl cellulose (CMC)
Applications
| N/A | Metrohm
NIR Spectroscopy
Instrumentation
NIR Spectroscopy
Manufacturer
Metrohm
Industries
Energy & Chemicals
10 and 45 Degree Specular Reflectance Accessories for the Agilent Cary 630 FTIR
Others
| 2022 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Obtaining Optimum Performance When Using the SIPS Accessory
Technical notes
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Measuring the reflective properties of architectural glass using the Agilent Cary 630 FTIR with 10 degree Specular Refl ectance Accessory
Applications
| 2013 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing
Ultratrace Tin Speciation with GC-ICP-MS using the Thermo Scientific GCI 100 Interface
Applications
| 2016 | Thermo Fisher Scientific
GC, ICP/MS, Speciation analysis
Instrumentation
GC, ICP/MS, Speciation analysis
Manufacturer
Thermo Fisher Scientific
Industries
Environmental
Characterizing Sub-Nanometer Narrow Bandpass Filters Using an Agilent Cary UV-Vis-NIR
Applications
| 2023 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
AGILENT SPS 4 AUTOSAMPLER
Brochures and specifications
| 2016 | Agilent Technologies
ICP/MS, ICP/OES, AAS, ICP/MS/MS, MP/ICP-AES
Instrumentation
ICP/MS, ICP/OES, AAS, ICP/MS/MS, MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements
Applications
| 2020 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike