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    Ion Lens Design

    Technical notes
    | 2021 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries

    IMPROVEMENTS IN A MULTI-REFLECTING TOF MASS SPECTROMETER TO ENHANCE MASS SPECTROMETRY IMAGING SPECIFICITY

    Posters
    | 2023 | Waters (ASMS)
    MS Imaging, LC/TOF, LC/HRMS, LC/MS, LC/MS/MS
    Instrumentation
    MS Imaging, LC/TOF, LC/HRMS, LC/MS, LC/MS/MS
    Manufacturer
    Waters
    Industries

    Analysis of Liquid Fertilizer by ICPE-9820

    Applications
    | 2020 | Shimadzu
    MP/ICP-AES
    Instrumentation
    MP/ICP-AES
    Manufacturer
    Shimadzu
    Industries
    Food & Agriculture

    CFRP Analysis, Testing and Inspection Evaluation Instruments

    Brochures and specifications
    | 2015 | Shimadzu
    X-ray
    Instrumentation
    X-ray
    Manufacturer
    Shimadzu
    Industries
    Materials Testing

    Absolute Reflectance Measurement of Anti-Reflective Film for Solar Cells Using the SolidSpec-3700

    Applications
    | N/A | Shimadzu
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Shimadzu
    Industries
    Materials Testing

    Solutions for Cellulose Nanofibers

    Guides
    | 2019 | Shimadzu
    UV–VIS spectrophotometry, FTIR Spectroscopy, Microscopy, XRD
    Instrumentation
    UV–VIS spectrophotometry, FTIR Spectroscopy, Microscopy, XRD
    Manufacturer
    Shimadzu
    Industries
    Energy & Chemicals

    Solving Doubly Charged Ion Interferences using an Agilent 8900 ICP-QQQ

    Technical notes
    | 2019 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Environmental

    Polarizer and Depolarizer for the Agilent Cary Series UV-Vis-NIR

    Brochures and specifications
    | 2012 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries

    Evaluation of Deuterium and Zeeman Background Correction with the Presence of Spectral Interferences Determinations of Arsenic in an Aluminium Matrix and Selenium in an Iron Matrix by GFAAS

    Technical notes
    | 1995 | Agilent Technologies
    AAS
    Instrumentation
    AAS
    Manufacturer
    Agilent Technologies
    Industries

    X-ray photoelectron spectrometer - AXIS Nova

    Brochures and specifications
    | 2018 | Shimadzu
    X-ray
    Instrumentation
    X-ray
    Manufacturer
    Shimadzu
    Industries
    Others
     

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