Accurate Mass Analysis of Naphthenic Acids by Argon NCI
Posters
| 2016 | Agilent Technologies
GC/MSD, GC/MS/MS, GC/HRMS, GC/Q-TOF
Instrumentation
GC/MSD, GC/MS/MS, GC/HRMS, GC/Q-TOF
Manufacturer
Agilent Technologies
Industries
Environmental
Characterization and Quantitative Hydrocarbon Group-Type Analysis of Plastic-Derived Pyrolysis Oils by GCxGC-TOFMS/FID
Presentations
| 2024 | LECO (MDCW)
GCxGC, GC/MSD, GC/HRMS, GC/TOF
Instrumentation
GCxGC, GC/MSD, GC/HRMS, GC/TOF
Manufacturer
LECO
Industries
Energy & Chemicals
Advanced Data Visualization: The Many Dimensions of Petroleomics Using High Resolution Gas Chromatography and Time-of-Flight Mass Spectrometry
Posters
| 2017 | LECO
GCxGC, GC/MSD, GC/HRMS, GC/TOF
Instrumentation
GCxGC, GC/MSD, GC/HRMS, GC/TOF
Manufacturer
LECO
Industries
Energy & Chemicals
Piecing Together Pollutant Profiles: Combining High-Resolution MS From Multiple Ionization Modes With Multidimensional GC for Petroleum Forensics and Environmental Analyses
Posters
| 2024 | LECO
GCxGC, GC/MSD, GC/TOF
Instrumentation
GCxGC, GC/MSD, GC/TOF
Manufacturer
LECO
Industries
Energy & Chemicals , Environmental
Identifying Disinfection Byproducts in Treated Water
Applications
| 2015 | LECO
GC/MSD, GC/HRMS, GC/TOF
Instrumentation
GC/MSD, GC/HRMS, GC/TOF
Manufacturer
Agilent Technologies, LECO
Industries
Environmental
U-SRM – Ultra Selective Detection of Analytes in Complex Matrix Samples on the TSQ Quantum XLS Ultra GC-MS/MS
Technical notes
| 2012 | Thermo Fisher Scientific
GC/MSD, GC/MS/MS, GC/QQQ
Instrumentation
GC/MSD, GC/MS/MS, GC/QQQ
Manufacturer
Thermo Fisher Scientific
Industries
High Resolution Deconvolution® Technical Brief
Technical notes
| 2019 | LECO
GC/MSD, GC/HRMS, GC/TOF, Software
Instrumentation
GC/MSD, GC/HRMS, GC/TOF, Software
Manufacturer
LECO
Industries
Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging
Applications
| 2014 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
7200 Series Q-TOF for GC/MS - A new analytical tool for solving complex analytical problems