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    Multilayer packaging material analysis using Laser Direct Infrared (LDIR) Imaging

    Applications
    | 2018 | Agilent Technologies
    FTIR Spectroscopy
    Instrumentation
    FTIR Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Fitted Background Correction (FBC)— fast, accurate and fully-automated background correction

    Technical notes
    | 2014 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries

    Fitted Background Correction (FBC) — fast, accurate and fully-automated background correction

    Technical notes
    | 2019 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries

    Rapid, Large-Area, Analysis of Microplastics from Plastic Bottles Using Laser Direct Infrared Imaging

    Applications
    | 2022 | Agilent Technologies
    FTIR Spectroscopy
    Instrumentation
    FTIR Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries
    Environmental, Materials Testing

    Rapid, Large-Area, On-Filter Analysis of Microplastics from Plastic Bottles Using Laser Direct Infrared Imaging

    Applications
    | 2022 | Agilent Technologies
    FTIR Spectroscopy
    Instrumentation
    FTIR Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries
    Environmental

    ICP-OES Background and Interference Removal

    Technical notes
    | 2020 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries

    ‘Fitted’ — Fast, accurate and fully- automated background correction

    Technical notes
    | 2012 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries

    Fitting Deuterium Lamp Background Correction to Agilent 50/55 AA Instruments

    Manuals
    | 2012 | Agilent Technologies
    AAS
    Instrumentation
    AAS
    Manufacturer
    Agilent Technologies
    Industries

    Quantitative Analysis of Elements in Small Quantity of Organic Matter by EDXRF - New Feature of Background FP Method

    Applications
    | 2013 | Shimadzu
    X-ray
    Instrumentation
    X-ray
    Manufacturer
    Shimadzu
    Industries
    Energy & Chemicals

    Evaluation of Deuterium and Zeeman Background Correction with the Presence of Spectral Interferences Determinations of Arsenic in an Aluminium Matrix and Selenium in an Iron Matrix by GFAAS

    Technical notes
    | 1995 | Agilent Technologies
    AAS
    Instrumentation
    AAS
    Manufacturer
    Agilent Technologies
    Industries
     

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