Fitted Background Correction (FBC)— fast, accurate and fully-automated background correction
Technical notes
| 2014 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
---
Fitted Background Correction (FBC) — fast, accurate and fully-automated background correction
Technical notes
| 2019 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
---
ICP-OES Background and Interference Removal
Technical notes
| 2020 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
---
‘Fitted’ — Fast, accurate and fully- automated background correction
Technical notes
| 2012 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
---
Fitting Deuterium Lamp Background Correction to Agilent 50/55 AA Instruments
Manuals
| 2012 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
---
Quantitative Analysis of Elements in Small Quantity of Organic Matter by EDXRF - New Feature of Background FP Method
Applications
| 2013 | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Energy & Chemicals
Evaluation of Deuterium and Zeeman Background Correction with the Presence of Spectral Interferences Determinations of Arsenic in an Aluminium Matrix and Selenium in an Iron Matrix by GFAAS
Technical notes
| 1995 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
---
Determination of Multiple Elements in Aquatic Products Using a Graphite Furnace Atomic Absorption Spectroscopy
Applications
| 2021 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Food & Agriculture
Benefits of running organic matrices using the Agilent 5100 ICP-OES—fast, robust, high performance analysis
Technical notes
| 2015 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
---
Analysis of Environmental Waters by ICP-OES per Standard Method