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Fitted Background Correction (FBC) — fast, accurate and fully-automated background correction
Technical notes
| 2019 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Fitted Background Correction (FBC)— fast, accurate and fully-automated background correction
Technical notes
| 2014 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
ICP-OES Background and Interference Removal
Technical notes
| 2020 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
‘Fitted’ — Fast, accurate and fully- automated background correction
Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Fitting Deuterium Lamp Background Correction to Agilent 50/55 AA Instruments
Manuals
| 2012 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Design Considerations for High Performance Background Correction Systems in Atomic Absorption Spectrometry
Brochures and specifications
| 2010 | Thermo Fisher Scientific
AAS
Instrumentation
AAS
Manufacturer
Thermo Fisher Scientific
Industries
Ultratrace Impurity Analysis of Ultrapure Water with Low Boron Background by ICP-MS/MS
Applications
| 2024 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Quantitative Analysis of Elements in Small Quantity of Organic Matter by EDXRF - New Feature of Background FP Method
Applications
| 2013 | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Energy & Chemicals
Other projects
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike