Security Measures for Protecting the Reliability of Measurement Data
Technical notes
| 2012 | Shimadzu
GC, Software, HPLC
Instrumentation
GC, Software, HPLC
Manufacturer
Shimadzu
Industries
Fast and Reliable Classification Analysis with Agilent MassHunter Classifier
Technical notes
| 2020 | Agilent Technologies
Software
Instrumentation
Software
Manufacturer
Agilent Technologies
Industries
Sampling and Sampling Containers as the Foundation for Reliable Water Analyses
Technical notes
| 2024 | ALS Europe (ALS Czech Republic)
Laboratory equipment
Instrumentation
Laboratory equipment
Manufacturer
Industries
Environmental
Fast Screening and Confirmation of Gamma-Hydroxybutyrate (GHB) in Urine
Technical notes
| 2008 | Restek
GC, GC/MSD, GC columns, Consumables
Instrumentation
GC, GC/MSD, GC columns, Consumables
Manufacturer
Restek
Industries
Forensics
More Reliable Dissolved Gas Analysis (DGA) Testing with an Enhanced Methanizer
Technical notes
| N/A | ARC
GC
Instrumentation
GC
Manufacturer
ARC
Industries
Energy & Chemicals
Effectiveness of Fast Scanning Measurement Using GC×GC-MS
Technical notes
| N/A | Shimadzu
GCxGC, GC/MSD, GC/SQ
Instrumentation
GCxGC, GC/MSD, GC/SQ
Manufacturer
Shimadzu, ZOEX/JSB
Industries
A New PEG GC Column with Improved Inertness Reliability and Column Lifetime
Technical notes
| 2016 | Agilent Technologies
GC columns, Consumables
Instrumentation
GC columns, Consumables
Manufacturer
Agilent Technologies
Industries
See Through Raman Technology: Expanded capabilities for through package identification using 785 nm and 1064 nm excitation Raman
Technical notes
| 2018 | Metrohm
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Metrohm
Industries
Efficient mitigation of fluorescence in Raman spectroscopy using SSE
Technical notes
| 2021 | Bruker Optics
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Bruker
Industries
Practical determination and validation of instrument detection limit for the Thermo Scientific ISQ 7000 Single Quadrupole GC-MS system with Advanced Electron Ionization source