OMNIS NIRS: An efficiency boost for your laboratory
Technical notes
| 2024 | Metrohm
NIR Spectroscopy, Software
Instrumentation
NIR Spectroscopy, Software
Manufacturer
Metrohm
Industries
Others
Introducing the XSeeker 8000 Bench-Top X-Ray CT System
Technical notes
| 2023 | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Materials Testing
Introducing the EDXIR-Holder: Sample Holder/Stocker for Contaminant Measurement
Technical notes
| 2017 | Shimadzu
FTIR Spectroscopy, X-ray
Instrumentation
FTIR Spectroscopy, X-ray
Manufacturer
Shimadzu
Industries
CCD and CID solid-state detectors
Technical notes
| 2012 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
CCD and CID solid-state detectors
Technical notes
| 2016 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
Understanding RoHS
Technical notes
| 2006 | Shimadzu
Instrumentation
Manufacturer
Shimadzu
Industries
Materials Testing
Measuring baseline-corrected spectra on a Cary 60 UV-Vis
Technical notes
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Near-Infrared Spectroscopy: Quantitative analysis according to ASTM E1655
Technical notes
| 2018 | Metrohm
NIR Spectroscopy
Instrumentation
NIR Spectroscopy
Manufacturer
Metrohm
Industries
Energy & Chemicals
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