Applications | LabRulez ICPMS

Low reflectance measurements using the ‘VW’ technique

Technical notes

| 2011 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Measuring optical densities over 10 Abs on the Agilent Cary 7000 Universal Measurement Spectrophotometer (UMS)

Technical notes

| 2013 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Comparing the limiting resolution of the Agilent Cary 5000 and Cary 6000i UVVis-NIR spectrophotometers using the transmission spectrum of water vapor

Technical notes

| 2011 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Near-infrared spectroscopy: Comparison of techniques

Technical notes

| 2017 | Metrohm

NIR Spectroscopy

Instrumentation

NIR Spectroscopy

Manufacturer

Metrohm

Industries

Materials Testing

Hollow Cathode Lamps

Technical notes

| 2018 | Agilent Technologies

AAS

Instrumentation

AAS

Manufacturer

Agilent Technologies

Industries

Hollow Cathode Lamps – Yesterday, Today and Tomorrow

Technical notes

| 2010 | Agilent Technologies

AAS

Instrumentation

AAS

Manufacturer

Agilent Technologies

Industries

Improvements in Detection Limits in Atomic Absorption Spectroscopy using the new digitally controlled Graphite Furnace - GFA-7000

Technical notes

| N/A | Shimadzu

AAS

Instrumentation

AAS

Manufacturer

Shimadzu

Industries

Effects of Filter Composition, Spectral Bandwidth, and Pathlength on Stray Light Levels in the Near-Infrared Region

Technical notes

| 2022 | Agilent Technologies

NIR Spectroscopy

Instrumentation

NIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Fitted Background Correction (FBC) — fast, accurate and fully-automated background correction

Technical notes

| 2019 | Agilent Technologies

ICP/OES

Instrumentation

ICP/OES

Manufacturer

Agilent Technologies

Industries

‘Fitted’ — Fast, accurate and fully- automated background correction

Technical notes

| 2012 | Agilent Technologies

ICP/OES

Instrumentation

ICP/OES

Manufacturer

Agilent Technologies

Industries

Applications | LabRulez ICPMS

Low reflectance measurements using the ‘VW’ technique

Measuring optical densities over 10 Abs on the Agilent Cary 7000 Universal Measurement Spectrophotometer (UMS)

Comparing the limiting resolution of the Agilent Cary 5000 and Cary 6000i UVVis-NIR spectrophotometers using the transmission spectrum of water vapor

Near-infrared spectroscopy: Comparison of techniques

Hollow Cathode Lamps

Hollow Cathode Lamps – Yesterday, Today and Tomorrow

Improvements in Detection Limits in Atomic Absorption Spectroscopy using the new digitally controlled Graphite Furnace - GFA-7000

Effects of Filter Composition, Spectral Bandwidth, and Pathlength on Stray Light Levels in the Near-Infrared Region

Fitted Background Correction (FBC) — fast, accurate and fully-automated background correction

‘Fitted’ — Fast, accurate and fully- automated background correction

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