ICPMS
Menu
More information
WebinarsAbout usContact usTerms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike
Language Čeština

    1. Databases

    1. Industries

    1. Instrumentation

    1. Manufacturer

    1. Author

    1. Content Type

    1. Publication Date

    Applications | LabRulez ICPMS

    High Throughput Large Spot Adaptor

    Technical notes
    | 2019 | Metrohm
    RAMAN Spectroscopy
    Instrumentation
    RAMAN Spectroscopy
    Manufacturer
    Metrohm
    Industries

    Anisotropy Measurement Using the Agilent Cary Eclipse Fluorescence Spectrophotometer

    Technical notes
    | 2015 | Agilent Technologies
    Fluorescence spectroscopy
    Instrumentation
    Fluorescence spectroscopy
    Manufacturer
    Agilent Technologies
    Industries

    Microplastics: from Beach to Bench Characterization and Identification of Microplastics Using Mobile FTIR and FTIR Imaging Technologies

    Technical notes
    | 2018 | Agilent Technologies
    FTIR Spectroscopy
    Instrumentation
    FTIR Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries
    Environmental, Materials Testing

    AA Troubleshooting and Maintenance Guide

    Technical notes
    | N/A | Agilent Technologies
    AAS
    Instrumentation
    AAS
    Manufacturer
    Agilent Technologies
    Industries

    Synchronous Vertical Dual View (SVDV) for superior speed and performance

    Technical notes
    | 2016 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries

    Synchronous Vertical Dual View (SVDV) for superior speed and performance

    Technical notes
    | 2014 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries

    Near-infrared spectroscopy: Comparison of techniques

    Technical notes
    | 2017 | Metrohm
    NIR Spectroscopy
    Instrumentation
    NIR Spectroscopy
    Manufacturer
    Metrohm
    Industries
    Materials Testing

    Low reflectance measurements using the ‘VW’ technique

    Technical notes
    | 2011 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries

    True simultaneous ICP-OES for unmatched speed and performance

    Technical notes
    | 2012 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries

    Superior ICP-OES optical design for unmatched speed and performance

    Technical notes
    | 2016 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries
     

    Related content

    ‌

    From a scientific project to a global business venture. The company mzio is striving to improve data analysis in mass spectrometry labs

    We, 29.5.2024
    Ústav organické chemie a biochemie AV ČR
    ‌

    Cryo-EM structures show how Trypanosomes escape the human innate immune response

    Tu, 28.5.2024
    Ústav organické chemie a biochemie AV ČR
    ‌

    An innovative approach to planar chiral substances

    Mo, 27.5.2024
    Katedra organické chemie Přírodovědecké fakulty Univerzity Karlovy
    ‌
    Other projects
    Follow us
    More information
    WebinarsAbout usContact usTerms of use
    LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike