Real-time Spectral Correction of Complex Samples using FACT Spectral Deconvolution Software
Technical notes
| 2021 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
Near-Infrared Spectroscopy: Quantitative analysis according to ASTM E1655
Technical notes
| 2018 | Metrohm
NIR Spectroscopy
Instrumentation
NIR Spectroscopy
Manufacturer
Metrohm
Industries
Energy & Chemicals
ICP-OES Background and Interference Removal
Technical notes
| 2020 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
How to optimize your ICP-OES methods
Technical notes
| 2017 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
Introducing the EDXIR-Holder: Sample Holder/Stocker for Contaminant Measurement
Technical notes
| 2017 | Shimadzu
FTIR Spectroscopy, X-ray
Instrumentation
FTIR Spectroscopy, X-ray
Manufacturer
Shimadzu
Industries
Improving the corn to ethanol fermentation process with near-infrared spectroscopy (NIRS)
Technical notes
| 2021 | Metrohm
NIR Spectroscopy
Instrumentation
NIR Spectroscopy
Manufacturer
Metrohm
Industries
Food & Agriculture
Evaluation of Deuterium and Zeeman Background Correction with the Presence of Spectral Interferences Determinations of Arsenic in an Aluminium Matrix and Selenium in an Iron Matrix by GFAAS
Technical notes
| 1995 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
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