Applications - page 1

Optical Characterization of Thin Films

Applications

| 2022 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Gaining Deeper Insights into Thin Film Response

Applications

| 2022 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

The determination of thin film thickness using reflectance spectroscopy

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

X-ray Fluorescence Analysis of Lead in Tin Plating Using Theoretical Intensity of Scattered X-rays - Analysis of RoHS Regulated Elements by Energy Dispersive X-ray Fluorescence Spectrometer (EDX)

Applications

| N/A | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

Micro-Raman Spectroscopy in Thin Section Analysis of Rock Mineralogy

Applications

| 2019 | Metrohm

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Metrohm

Industries

Materials Testing

Analysis of CIGS Solar Cell by ICPE-9000

Applications

| N/A | Shimadzu

GD/MP/ICP-AES

Instrumentation

GD/MP/ICP-AES

Manufacturer

Shimadzu

Industries

Materials Testing

Investigation of a CIGS solar cell with ARL EQUINOX 100 X-ray Diffractometer and ARL QUANT'X EDXRF Spectrometer

Applications

| 2020 | Thermo Fisher Scientific

X-ray, XRD

Instrumentation

X-ray, XRD

Manufacturer

Thermo Fisher Scientific

Industries

Energy & Chemicals

Determining the effects of angle on the infra-red reflectance properties of thin films in architectural glass using the Agilent Cary 630 FTIR

Applications

| 2013 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing

Errors Associated With Thin Film Measurements Using XPS at a Single Angle

Applications

| 2008 | Thermo Fisher Scientific

X-ray

Instrumentation

X-ray

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing

Analysis of Trace Elements in Water using Ultra Thin Film (1)

Applications

| N/A | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Environmental