Applications | LabRulez ICPMS

Optical Characterization of Thin Films

Applications

| 2022 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

The characterization of optical components using the Cary Deep UV spectrophotometer and ‘VW’ specular reflectance accessory

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Direct Analysis of Metallic Impurities in SiC and GaN Wafers by LA-GED-MSAG-ICP-MS/MS

Applications

| 2023 | Agilent Technologies

ICP/MS, ICP/MS/MS, Laser ablation

Instrumentation

ICP/MS, ICP/MS/MS, Laser ablation

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Concentration Analysis of Ultra-microvolume Samples by UV-Vis Spectroscopy

Applications

| 2022 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Pharma & Biopharma

The deep ultraviolet spectroscopic properties of a next-generation photoresist

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

The determination of thin film thickness using reflectance spectroscopy

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Micro Volume Photometric Measurement of Nucleic Acid using TrayCell with UV-1280

Applications

| 2015 | Shimadzu

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Shimadzu

Industries

Pharma & Biopharma

Evaluation of the Cary Absolute Specular Reflectance accessory for the measurement of optical constants of thin films

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films

Applications

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Monitoring of DOTP production via esterification with inline analysis

Applications

| 2021 | Metrohm

NIR Spectroscopy

Instrumentation

NIR Spectroscopy

Manufacturer

Metrohm

Industries

Energy & Chemicals

Applications | LabRulez ICPMS

Optical Characterization of Thin Films

The characterization of optical components using the Cary Deep UV spectrophotometer and ‘VW’ specular reflectance accessory

Direct Analysis of Metallic Impurities in SiC and GaN Wafers by LA-GED-MSAG-ICP-MS/MS

Concentration Analysis of Ultra-microvolume Samples by UV-Vis Spectroscopy

The deep ultraviolet spectroscopic properties of a next-generation photoresist

The determination of thin film thickness using reflectance spectroscopy

Micro Volume Photometric Measurement of Nucleic Acid using TrayCell with UV-1280

Evaluation of the Cary Absolute Specular Reflectance accessory for the measurement of optical constants of thin films

Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films

Monitoring of DOTP production via esterification with inline analysis

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