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Determination of trace elements in ultrapure semiconductor grade sulfuric acid using the Agilent 8900 ICP-QQQ in MS/MS mode
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| 2018 | Agilent Technologies
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Agilent Technologies
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Semiconductor Analysis
Agilent 8800 Triple Quadrupole ICP-MS – Site Preparation Checklist
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| 2015 | Agilent Technologies
ICP/MS, ICP/MS/MS
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ICP/MS, ICP/MS/MS
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Agilent Technologies
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The ultratrace determination of iodine 129 in aqueous samples using the 7700x ICP-MS with oxygen reaction mode
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| 2013 | Agilent Technologies
ICP/MS
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Agilent Technologies
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Evaluation of Three Methods of Matrix Modifier Injection in Graphite Furnace AAS
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| 2010 | Agilent Technologies
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Agilent Technologies
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Introduction to Raman Spectroscopy
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| 2015 | Metrohm
RAMAN Spectroscopy
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Transitioning from PTFE to PFA
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| 2018 | Savillex
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Savillex
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Agilent SLIMS - SLIMS 7.2 Version
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| 2025 | Agilent Technologies
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Measurement of Fixed Carbon, Volatile Matter, and Ash of Biocoke
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| 2026 | Shimadzu
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Shimadzu
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Online analysis of copper, tin, and zinc in white bronze baths by XRF
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| 2025 | Metrohm
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Metrohm
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Modular Compact Rheometer MCR 72 | MCR 92
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| 2025 | Anton Paar
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Anton Paar
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Materials Testing
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