Library - page 81 | LabRulez ICPMS

Infrared Microscope AIMsight

Brochures and specifications

| 2026 | Shimadzu

FTIR Spectroscopy, Microscopy

Instrumentation

FTIR Spectroscopy, Microscopy

Manufacturer

Shimadzu

Industries

ICP-OES Analysis of Copper Recovered from Li-Ion Batteries for Foil Manufacturing

Applications

| 2025 | Agilent Technologies

ICP-OES

Instrumentation

ICP-OES

Manufacturer

Agilent Technologies

Industries

Materials Testing

Thermo Scientific OXSAS

Brochures and specifications

| 2017 | Thermo Fisher Scientific

Optical Emission Spectroscopy (OES), Software

Instrumentation

Optical Emission Spectroscopy (OES), Software

Manufacturer

Thermo Fisher Scientific

Industries

Microfocus X-Ray Inspection System Xslicer SMX-6010

Brochures and specifications

| 2023 | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Agilent Cary 8454 Spectrophotometer

Brochures and specifications

| 2014 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Application of Automated Data Collection to Surface-Enhanced Raman Scattering (SERS)

Applications

| 2010 | Thermo Fisher Scientific

RAMAN Spectroscopy, Microscopy, Software

Instrumentation

RAMAN Spectroscopy, Microscopy, Software

Manufacturer

Thermo Fisher Scientific

Industries

Forensics

The Avantage Data System

Applications

| 2008 | Thermo Fisher Scientific

X-ray, Software

Instrumentation

X-ray, Software

Manufacturer

Thermo Fisher Scientific

Industries

Ion Chromatography (IC) ICP-MS for Chromium Speciation in Natural Samples

Applications

| 2005 | Agilent Technologies

Ion chromatography, IC-MS, ICP/MS, Speciation analysis

Instrumentation

Ion chromatography, IC-MS, ICP/MS, Speciation analysis

Manufacturer

Agilent Technologies, Metrohm

Industries

Environmental

Applications of ICP-MS in Homeland Security

Technical notes

| 2004 | Agilent Technologies

GC, ICP/MS, Speciation analysis

Instrumentation

GC, ICP/MS, Speciation analysis

Manufacturer

Agilent Technologies

Industries

Homeland Security

Determination of Trace Metal Impurities in Semiconductor Grade Phosphoric Acid by High Sensitivity Reaction Cell ICP-MS

Applications

| 2003 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis