Library - page 59 | LabRulez ICPMS

Expanding the analytical range utilizing 1013 Ω amplifier technology: Measurement of 100 pg Nd samples

Applications

| 2018 | Thermo Fisher Scientific

Elemental Analysis, GC/HRMS, GC/MSD

Instrumentation

Elemental Analysis, GC/HRMS, GC/MSD

Manufacturer

Thermo Fisher Scientific

Industries

Environmental

Synchronous Vertical Dual View (SVDV) for superior speed and performance

Technical notes

| 2016 | Agilent Technologies

ICP-OES

Instrumentation

ICP-OES

Manufacturer

Agilent Technologies

Industries

Composite heat damage measurement using the handheld Agilent 4100 ExoScan FTIR

Applications

| 2015 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing

Anisotropy Measurement Using the Agilent Cary Eclipse Fluorescence Spectrophotometer

Technical notes

| 2015 | Agilent Technologies

Fluorescence spectroscopy

Instrumentation

Fluorescence spectroscopy

Manufacturer

Agilent Technologies

Industries

Synchronous Vertical Dual View (SVDV) for superior speed and performance

Technical notes

| 2014 | Agilent Technologies

ICP-OES

Instrumentation

ICP-OES

Manufacturer

Agilent Technologies

Industries

Thermo Scientific picoSpin 45 Nuclear Magnetic Resonance Aldol Condensation Reaction

Applications

| 2013 | Thermo Fisher Scientific

NMR

Instrumentation

NMR

Manufacturer

Thermo Fisher Scientific

Industries

Other

Fast, effective evaluation of edible bird nests using the handheld Agilent 4100 ExoScan FTIR

Applications

| 2012 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Food & Agriculture

Agilent ICP-OES SVS 2 Productivity Package Installation and Upgrade Instructions

Manuals

| 2012 | Agilent Technologies

ICP-OES

Instrumentation

ICP-OES

Manufacturer

Agilent Technologies

Industries

Characterization of Amorphous and Microcrystalline Silicon using Raman Spectroscopy

Applications

| 2009 | Thermo Fisher Scientific

RAMAN Spectroscopy, Microscopy

Instrumentation

RAMAN Spectroscopy, Microscopy

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing, Semiconductor Analysis

Characterization of Silicon Oxide and Oxynitride Layers

Applications

| 2008 | Thermo Fisher Scientific

X-ray

Instrumentation

X-ray

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing