On-site detection of hexavalent chromium in protective paint primers

Technical notes
| 2021 | Metrohm
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Metrohm
Industries
Materials Testing

HYPERION II FT-IR | FPA | IR Laser Imaging Microscope

Brochures and specifications
| 2021 | Bruker Optics
FTIR Spectroscopy, Microscopy
Instrumentation
FTIR Spectroscopy, Microscopy
Manufacturer
Bruker
Industries
Materials Testing

Diamond Analysis

Brochures and specifications
| 2021 | Bruker Optics
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Bruker
Industries
Materials Testing

Accurate determination of 129I in environmental samples using triple quadrupole ICP-MS

Applications
| 2020 | Thermo Fisher Scientific
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Thermo Fisher Scientific
Industries
Environmental

Triple Quadrupole ICP-MS or High Resolution ICP-MS? Which Instrument is Right for Me?

Technical notes
| 2017 | Thermo Fisher Scientific
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Thermo Fisher Scientific
Industries
Food & Agriculture

Agilent UV-Vis ChemStation for Revision B.05.xx – Site Preparation Checklist

Manuals
| 2014 | Agilent Technologies
Software, UV–VIS spectrophotometry
Instrumentation
Software, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries

IDENTIFYING NATURAL GEMS FROM SYNTHETIC AND TREATED COUNTERPARTS USING THE AGILENT CARY 660

Applications
| 2014 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing

Reflectance Measurements of an Apple and Pear, and Prediction of Elapsed Days by Multivariate Analysis

Applications
| 2013 | Shimadzu
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Shimadzu
Industries
Food & Agriculture

Analysis of High Solids Solutions by Flame Atomic Absorption

Technical notes
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries

Determination of Trace Impurities in High-Purity Copper by Sequential ICP-OES with Axial Viewing

Applications
| 2010 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Other projects
GCMS
LCMS
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