Library - page 51 | LabRulez ICPMS

ICP-OES Quality Control of Elements in Brines Produced by Direct Lithium Extraction (DLE)

Applications

| 2025 | Agilent Technologies

ICP-OES

Instrumentation

ICP-OES

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals

The Latest Advances in Axially Viewed Simultaneous ICP-OES for Elemental Analysis

Technical notes

| 2010 | Agilent Technologies

ICP-OES

Instrumentation

ICP-OES

Manufacturer

Agilent Technologies

Industries

Optimizing Microplastic Characterization by LDIR: Automated versus Manual Workflows

Technical notes

| 2025 | Agilent Technologies

FTIR Spectroscopy, Particle size analysis

Instrumentation

FTIR Spectroscopy, Particle size analysis

Manufacturer

Agilent Technologies

Industries

Materials Testing

Rotational Viscometers ViscoQC Series

Brochures and specifications

| 2023 | Anton Paar

Viscometers

Instrumentation

Viscometers

Manufacturer

Anton Paar

Industries

Thermomechanical Analyzer TMA-60 Series

Brochures and specifications

| 2022 | Shimadzu

Thermal Analysis

Instrumentation

Thermal Analysis

Manufacturer

Shimadzu

Industries

Materials Testing

Automated, Unattended, Multi-Angle Transmission and Absolute Reflection Measurements

Applications

| 2022 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Automated, unattended multi-angle transmission and absolute refl ection measurements on architectural and automotive glass using the Agilent Cary 7000 Universal Measurement Spectrophotometer (UMS)

Applications

| 2013 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Geological and metal sample surface mapping with WDXRF spectrometer

Applications

| 2024 | Thermo Fisher Scientific

X-ray

Instrumentation

X-ray

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing

Analysis of 50 nm Silica Nanoparticles in Semiconductor Process Chemicals by spICP-MS/MS

Applications

| 2023 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

On-site Identification of Improvised Incendiary Devices: Integrated Chemical ID and Decision Guidance with MIRA DS and HazMasterG3

Technical notes

| 2021 | Metrohm

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Metrohm

Industries

Homeland Security