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XPS depth profiling of coated nitrided steel using femtosecond laser ablation
Applications
| 2025 | Thermo Fisher Scientific
X-ray, Laser ablation
Instrumentation
X-ray, Laser ablation
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
HPX Series Inert Hotplate
Brochures and specifications
| 2019 | Savillex
Sample Preparation
Instrumentation
Sample Preparation
Manufacturer
Savillex
Industries
Optical Characterization of Materials Using Spectroscopy
Guides
| 2023 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Materials Testing, Semiconductor Analysis
Solutions for Biomaterials Surface Characterization
Brochures and specifications
| 2025 | Anton Paar
Particle characterization, Particle size analysis, Rheometry, Laboratory instruments, Mechanical testing
Instrumentation
Particle characterization, Particle size analysis, Rheometry, Laboratory instruments, Mechanical testing
Manufacturer
Anton Paar
Industries
Materials Testing
At-Site. Immediate Results. True Nondestructive Analysis.
Brochures and specifications
| 2025 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Quantitative Depth Profile (QDP) Analysis of Plated Samples
Technical notes
| 2006 | LECO
GD/MP/ICP-AES, Elemental Analysis
Instrumentation
GD/MP/ICP-AES, Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals
Measuring the reflective properties of architectural glass using the Agilent Cary 630 FTIR with 10 degree Specular Refl ectance Accessory
Applications
| 2013 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing
Design Features of the HPX Series Inert Hotplate
Technical notes
| 2017 | Savillex
Sample Preparation
Instrumentation
Sample Preparation
Manufacturer
Savillex
Industries
The deep ultraviolet spectroscopic properties of a next-generation photoresist
Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements
Applications
| 2020 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike