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Determination of Trace Metal Impurities in Semiconductor Grade Phosphoric Acid by High Sensitivity Reaction Cell ICP-MS
Applications
| 2003 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Meeting Worldwide Regulatory Requirements for the Analysis of Trace Metals in Drinking Water Using the Agilent 7500c ICP-MS
Applications
| 2003 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS
Applications
| 2003 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Fast and Accurate Determination of Arsenobetaine (AsB) in Fish Tissues Using HPLC-ICP-MS
Applications
| 2003 | Agilent Technologies
HPLC, ICP/MS, Speciation analysis
Instrumentation
HPLC, ICP/MS, Speciation analysis
Manufacturer
Agilent Technologies
Industries
Food & Agriculture
Oxygen and Nitrogen in Nitride Material
Applications
| 2003 | LECO
Elemental Analysis
Instrumentation
Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals
Oxygen and Nitrogen Analysis in Calcium Fluoride
Applications
| 2003 | LECO
Elemental Analysis
Instrumentation
Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals
Ultra Low Nitrogen and Oxygen in Iron, Steel, Nickel-Base, and Cobalt-Base Alloys
Applications
| 2003 | LECO
Elemental Analysis
Instrumentation
Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals
Nitrogen in Fertilizer
Applications
| 2003 | LECO
Elemental Analysis
Instrumentation
Elemental Analysis
Manufacturer
LECO
Industries
Food & Agriculture
Other projects
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike