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The TOC-4100 in wastewater treatment plants
Others
| 2001 | Shimadzu
TOC
Instrumentation
TOC
Manufacturer
Shimadzu
Industries
Environmental
Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)
Applications
| 2001 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Swab Method for TC – Determination of polluted surfaces
Applications
| 2000 | Shimadzu
TOC
Instrumentation
TOC
Manufacturer
Shimadzu
Industries
General Features of the New Agilent 7500 ICP-MS
Brochures and specifications
| 2000 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
TOC DETERMINATION IN SLUDGE
Applications
| 1998 | Shimadzu
TOC
Instrumentation
TOC
Manufacturer
Shimadzu
Industries
Environmental
TOC-ANALYSIS OF DRINKING WATER
Applications
| 1997 | Shimadzu
TOC
Instrumentation
TOC
Manufacturer
Shimadzu
Industries
Environmental
Evaluation of Deuterium and Zeeman Background Correction with the Presence of Spectral Interferences Determinations of Arsenic in an Aluminium Matrix and Selenium in an Iron Matrix by GFAAS
Technical notes
| 1995 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Element-specific examination of volatile halogenated organics in wastewater extracts using GC-ICP-MS
Posters
| N/A | Agilent Technologies
GC, ICP/MS, Speciation analysis
Instrumentation
GC, ICP/MS, Speciation analysis
Manufacturer
Agilent Technologies
Industries
Environmental
Other projects
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike