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‘Fitted’ — Fast, accurate and fully- automated background correction
Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
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Agilent Technologies
Industries
Dedicated axial or radial plasma view for superior speed and performance
Technical notes
| 2012 | Agilent Technologies
ICP-OES
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ICP-OES
Manufacturer
Agilent Technologies
Industries
True simultaneous ICP-OES for unmatched speed and performance
Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
FACT spectral deconvolution
Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
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Agilent Technologies
Industries
Ultra-fast ICP-OES determinations of base metals in geochemical samples using next generation sample introduction technology
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| 2012 | Agilent Technologies
ICP-OES
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ICP-OES
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Agilent Technologies
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Environmental
CCD and CID solid-state detectors
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| 2012 | Agilent Technologies
ICP-OES
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ICP-OES
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Agilent Technologies
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Direct measurement of trace rare earth elements (REEs) in high-purity REE oxide using the Agilent 8800 Triple Quadrupole ICP-MS with MS/MS mode
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| 2012 | Agilent Technologies
ICP/MS, ICP/MS/MS
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ICP/MS, ICP/MS/MS
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Agilent Technologies
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Materials Testing
Trace elemental analysis of distilled alcoholic beverages using the Agilent 7700x ICP-MS with octopole collision/ reaction cell
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| 2012 | Agilent Technologies
ICP/MS
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ICP/MS
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Agilent Technologies
Industries
Food & Agriculture
Determination of exchangeable cations in soil extracts using the Agilent 4100 Microwave Plasma-Atomic Emission Spectrometer
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| 2012 | Agilent Technologies
GD/MP/ICP-AES
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GD/MP/ICP-AES
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Agilent Technologies
Industries
The ultratrace determination of iodine 129 using the Agilent 8800 Triple Quadrupole ICP-MS in MS/MS mode
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| 2012 | Agilent Technologies
ICP/MS, ICP/MS/MS
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ICP/MS, ICP/MS/MS
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Agilent Technologies
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Energy & Chemicals
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