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Low-level speciated analysis of Cr(III) and Cr(VI) using LC(IC)-ICP-MS
Applications
| 2012 | Agilent Technologies
HPLC, ICP/MS, Speciation analysis
Instrumentation
HPLC, ICP/MS, Speciation analysis
Manufacturer
Agilent Technologies
Industries
Environmental
New Breakthrough in Wet Chemical TOC Analysis Humic Acid: A Complex Molecule, A Simple Solution
Applications
| N/A | Shimadzu
TOC
Instrumentation
TOC
Manufacturer
Shimadzu
Industries
Environmental
Gaining Deeper Insights into Thin Film Response
Applications
| 2022 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Real-time Spectral Correction of Complex Samples using FACT Spectral Deconvolution Software
Technical notes
| 2021 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Choosing the Most Suitable Laser Wavelength For Your Raman Application
Technical notes
| 2018 | Metrohm
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Metrohm
Industries
Synchronous Vertical Dual View (SVDV) for superior speed and performance
Technical notes
| 2016 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Synchronous Vertical Dual View (SVDV) for superior speed and performance
Technical notes
| 2014 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
FACT spectral deconvolution
Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Other projects
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WebinarsAbout usContact usTerms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike