Determination of Ultratrace Impurities in Semiconductor Photoresist Using ICP-MS/MS

Applications
| 2023 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Monitoring of Adhesive Curing using Time Course Measurement with FTIR Spectroscopy

Applications
| 2023 | Shimadzu
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Shimadzu
Industries
Materials Testing

Process optimization and pre-clinical production of lipid nanoparticles using Sunshine

Applications
| 2023 | Unchained Labs
Particle characterization
Instrumentation
Particle characterization
Manufacturer
Unchained Labs
Industries
Pharma & Biopharma, Lipidomics

Online monitoring of sulfuric acid and hydrogen peroxide using Raman spectroscopy

Applications
| 2023 | Metrohm
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Metrohm
Industries
Semiconductor Analysis

Identification of Starting Materials in Pharmaceutical industry using STRam ® -1064

Applications
| 2022 | Metrohm
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Metrohm
Industries
Pharma & Biopharma

Fast, Easy, and Reliable Measurements of Liquid Samples Using Transmission FTIR

Applications
| 2021 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Pharma & Biopharma

Measurement of Multiple Heavy Metals in Plating Wastewater Using Flame AAS

Applications
| 2021 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Environmental

Determination of elemental impurities in lithium iron phosphate using ICP-OES

Applications
| 2021 | Thermo Fisher Scientific
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Thermo Fisher Scientific
Industries
Energy & Chemicals

Determination of 14 Impurity Elements in Lithium Carbonate Using ICP-OES

Applications
| 2020 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Environmental

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Applications
| 2020 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
Other projects
GCMS
LCMS
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