Applications - page 20

Understanding the Glow Discharge Source

Technical notes

| 2007 | LECO

GD/MP/ICP-AES, Elemental Analysis

Instrumentation

GD/MP/ICP-AES, Elemental Analysis

Manufacturer

LECO

Industries

Materials Testing, Energy & Chemicals

Safety - Gaseous hydrogen

Technical notes

| 2014 | Air Products

Consumables

Instrumentation

Consumables

Manufacturer

Air Products

Industries

Safety - Gaseous oxygen

Technical notes

| 2014 | Air Products

Consumables

Instrumentation

Consumables

Manufacturer

Air Products

Industries

Efficient mitigation of fluorescence in Raman spectroscopy using SSE

Technical notes

| 2021 | Bruker Optics

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Bruker

Industries

‘Fitted’ — Fast, accurate and fully- automated background correction

Technical notes

| 2012 | Agilent Technologies

ICP-OES

Instrumentation

ICP-OES

Manufacturer

Agilent Technologies

Industries

Measuring baseline-corrected spectra on a Cary 60 UV-Vis

Technical notes

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Precision and Detail Ensured by Scanning Electron Microscopy

Technical notes

| 2024 | ALS Europe (ALS Czech Republic)

X-ray, Microscopy

Instrumentation

X-ray, Microscopy

Manufacturer

Industries

Materials Testing

Fast track mass spec sample prep

Technical notes

| 2020 | Unchained Labs

Sample Preparation

Instrumentation

Sample Preparation

Manufacturer

Unchained Labs

Industries

Simple Steps for Clearing a Blocked Injector in Your ICP-OES Torch

Technical notes

| 2018 | Agilent Technologies

ICP-OES

Instrumentation

ICP-OES

Manufacturer

Agilent Technologies

Industries

Fitted Background Correction (FBC)— fast, accurate and fully-automated background correction

Technical notes

| 2014 | Agilent Technologies

ICP-OES

Instrumentation

ICP-OES

Manufacturer

Agilent Technologies

Industries