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High Precision Analysis of Major Components in Precious Metals by ICP-OES
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| 2025 | Agilent Technologies
ICP-OES
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ICP-OES
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Agilent Technologies
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Materials Testing
Analyzing SiC/Co materials for radar absorption and EMI shielding using ARL X’TRA Companion XRD
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| 2025 | Thermo Fisher Scientific
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Thermo Fisher Scientific
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Materials Testing
Raman Spectroscopy: Deciphering the Structural Dynamics of 2D Semiconductors
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| 2025 | Thermo Fisher Scientific
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RAMAN Spectroscopy
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Thermo Fisher Scientific
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Semiconductor Analysis
Product Inspection: Application solutions—tires, windshields, airbags
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| 2025 | Thermo Fisher Scientific
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Thermo Fisher Scientific
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Inline monitoring of fermentation processes
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| 2024 | Metrohm
NIR Spectroscopy
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NIR Spectroscopy
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Metrohm
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Energy & Chemicals
Ultratrace Impurity Analysis of Ultrapure Water with Low Boron Background by ICP-MS/MS
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| 2024 | Agilent Technologies
ICP/MS, ICP/MS/MS
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ICP/MS, ICP/MS/MS
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Agilent Technologies
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Semiconductor Analysis
Observation of Cosmetics and Containers Using X-Ray CT System
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| 2024 | Shimadzu
X-ray
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X-ray
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Shimadzu
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Evaluating Chromotropism with a Spectrophotometer: Solvatochromism and Thermochromism
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| 2024 | Shimadzu
UV–VIS spectrophotometry
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UV–VIS spectrophotometry
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Shimadzu
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Energy & Chemicals
Quantification of cotton content in textiles by near-infrared spectroscopy
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| 2024 | Metrohm
NIR Spectroscopy
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NIR Spectroscopy
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Metrohm
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Materials Testing
Monitoring complexing agents in galvanic baths inline with Raman spectroscopy
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| 2024 | Metrohm
RAMAN Spectroscopy
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RAMAN Spectroscopy
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Metrohm
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