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Determining the effects of angle on the infra-red reflectance properties of thin films in architectural glass using the Agilent Cary 630 FTIR
Applications
| 2013 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing
Errors Associated With Thin Film Measurements Using XPS at a Single Angle
Applications
| 2008 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Analysis of Trace Elements in Water using Ultra Thin Film (1)
Applications
| N/A | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Environmental
Analysis of Trace Elements in Water using Ultra Thin Film (2)
Applications
| N/A | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Environmental
Thermo Scientific ARL EQUINOX 100 X-ray Diffractometers
Brochures and specifications
| 2023 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Pharma & Biopharma, Materials Testing, Energy & Chemicals
Thin Multilayer Analysis Using the Agilent 8700 LDIR Chemical Imaging System
Applications
| 2025 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing
K-Alpha: Compositional XPS Analysis of a Cu(In,Ga)Se2 Solar Cell
Applications
| 2011 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Optical Characteristics and Thickness of 2-layered Structures
Applications
| 2018 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike