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OXSAS software option for Thermo Scientific OES and XRF spectrometers
Brochures and specifications
| 2018 | Thermo Fisher Scientific
X-ray, Optical Emission Spectroscopy (OES), Software
Instrumentation
X-ray, Optical Emission Spectroscopy (OES), Software
Manufacturer
Thermo Fisher Scientific
Industries
ICP-OES Background and Interference Removal
Technical notes
| 2020 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
EDXRF Analysis of Cd and Pb
Applications
| N/A | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Materials Testing
Quantitative Analysis of Lead in Bismuth Bronze - Matrix Elements/Profile Correction and Comparison with AA
Applications
| 2017 | Shimadzu
AAS, X-ray
Instrumentation
AAS, X-ray
Manufacturer
Shimadzu
Industries
Materials Testing
Evaluation of Deuterium and Zeeman Background Correction with the Presence of Spectral Interferences Determinations of Arsenic in an Aluminium Matrix and Selenium in an Iron Matrix by GFAAS
Technical notes
| 1995 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
X-ray Fluorescence Analysis of Lead in Tin Plating Using Theoretical Intensity of Scattered X-rays - Analysis of RoHS Regulated Elements by Energy Dispersive X-ray Fluorescence Spectrometer (EDX)
Applications
| N/A | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Materials Testing
Analysis of Steel and Its Alloys by ICP-OES Following the GB/T 20125- 2006 Standard
Applications
| 2022 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Materials Testing
Content Analysis of Heavy Metals in Soil by ICP-MS
Applications
| 2025 | Shimadzu
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Shimadzu
Industries
Food & Agriculture
Other projects
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