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Fitted Background Correction (FBC) — fast, accurate and fully-automated background correction
Technical notes
| 2019 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
Fitted Background Correction (FBC)— fast, accurate and fully-automated background correction
Technical notes
| 2014 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
‘Fitted’ — Fast, accurate and fully- automated background correction
Technical notes
| 2012 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
Fitting Deuterium Lamp Background Correction to Agilent 50/55 AA Instruments
Manuals
| 2012 | Agilent Technologies
AAS
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AAS
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Agilent Technologies
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Measuring baseline-corrected spectra on a Cary 60 UV-Vis
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| 2011 | Agilent Technologies
UV–VIS spectrophotometry
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UV–VIS spectrophotometry
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Agilent Technologies
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Simplifying Correction of Doubly Charged Ion Interferences with Agilent ICP-MS MassHunter
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| 2019 | Agilent Technologies
Software, ICP/MS
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Software, ICP/MS
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Agilent Technologies
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Real-time Spectral Correction of Complex Samples using FACT Spectral Deconvolution Software
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| 2021 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
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Agilent Technologies
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ICP-OES Background and Interference Removal
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| 2020 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
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Agilent Technologies
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Measurement of Chromium in Environmental Waters by Zeeman Corrected Graphite Tube Atomization
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| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
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Agilent Technologies
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Environmental
EDXRF Analysis of Cd and Pb
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| N/A | Shimadzu
X-ray
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X-ray
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Shimadzu
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Materials Testing
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