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Analysis of 50 nm Silica Nanoparticles in Semiconductor Process Chemicals by spICP-MS/MS
Applications
| 2023 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Nitrogen in Soil and Plant Tissue
Applications
| 2022 | LECO
Elemental Analysis
Instrumentation
Elemental Analysis
Manufacturer
LECO
Industries
Food & Agriculture
Determination of Nitrogen/Protein in Whey Products
Applications
| 2022 | LECO
Elemental Analysis
Instrumentation
Elemental Analysis
Manufacturer
LECO
Industries
Food & Agriculture
Determination of Nitrogen/Protein in Grains, Feeds, and Pet Food
Applications
| 2022 | LECO
Elemental Analysis
Instrumentation
Elemental Analysis
Manufacturer
LECO
Industries
Food & Agriculture
Fluorescence-free 785 nm material identification with MIRA XTR DS
Technical notes
| 2021 | Metrohm
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Metrohm
Industries
Homeland Security
HYPERION II FT-IR | FPA | IR Laser Imaging Microscope
Brochures and specifications
| 2021 | Bruker Optics
FTIR Spectroscopy, Microscopy
Instrumentation
FTIR Spectroscopy, Microscopy
Manufacturer
Bruker
Industries
Materials Testing
Solving Doubly Charged Ion Interferences using an Agilent 8900 ICP-QQQ
Technical notes
| 2019 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Surface Enhanced Raman Scattering (SERS) – Expanding the Limits of Conventional Raman Analysis
Technical notes
| 2018 | Metrohm
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Metrohm
Industries
Other projects
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike