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The determination of thin film thickness using reflectance spectroscopy
Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Analysis of As, P dopant distribution of NMOS transistor by FESTEM & EDS
Applications
| 2009 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing, Energy & Chemicals
Canadian distillery Hiram Walker: “Measuring devices are best when they just run and run.”
Others
| N/A | Anton Paar
Density Meters
Instrumentation
Density Meters
Manufacturer
Anton Paar
Industries
Food & Agriculture
Agilent ICP-MS Journal (February 2016 – Issue 64)
Others
| 2016 | Agilent Technologies
ICP/MS, Speciation analysis
Instrumentation
ICP/MS, Speciation analysis
Manufacturer
Agilent Technologies
Industries
Food & Agriculture
Testing and Evaluation Equipment for the Aerospace Industry
Brochures and specifications
| 2013 | Shimadzu
Mechanical testing
Instrumentation
Mechanical testing
Manufacturer
Shimadzu
Industries
Materials Testing, Energy & Chemicals
Konference CEEPC/IPM/CMSC 2022 - Sborník abstraktů
Others
| 2022 | Czech Mass Spectrometry Conferences (CSMS) (Czech Society for Mass Spectrometry)
Instrumentation
Manufacturer
Industries
Evaluating Silicon using Raman Microscopy
Applications
| 2024 | Thermo Fisher Scientific
RAMAN Spectroscopy, Microscopy
Instrumentation
RAMAN Spectroscopy, Microscopy
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing, Semiconductor Analysis
UniBloc Performance Balances UP Series
Brochures and specifications
| 2019 | Shimadzu
Laboratory instruments
Instrumentation
Laboratory instruments
Manufacturer
Shimadzu
Industries
Other
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike