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Automated Multipurpose Powder X-Ray Diffractometer
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| 2021 | Anton Paar
XRD
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XRD
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Anton Paar
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Materials Testing
Technical Overview and Performance Capability of the Agilent 7900s ICP-MS for Semiconductor Applications
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| 2020 | Agilent Technologies
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Agilent Technologies
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Semiconductor Analysis
Elemental Profiling of Whiskey using the Agilent 5100/5110 ICP-OES and MPP Chemometrics Software
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| 2017 | Agilent Technologies
ICP-OES
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Agilent Technologies
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Time-resolved Measurements Using the Agilent Cary Eclipse Fluorescence Spectrophotometer
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| 2016 | Agilent Technologies
Fluorescence spectroscopy
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Fluorescence spectroscopy
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Agilent Technologies
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High-Throughput Semiquantitative Screening of Ambient Air Samples by ORS-ICP-MS and Integrated Sample Introduction System (ISIS)
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| 2007 | Agilent Technologies
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High Vacuum Gas Sorption Analyzers Autosorb Series
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| 2024 | Anton Paar
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Anton Paar
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Handheld FTIR Spectroscopic Applications of Modern Coatings
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| 2018 | Agilent Technologies
FTIR Spectroscopy
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FTIR Spectroscopy
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Agilent Technologies
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Determination of ultra trace elements in high purity hydrogen peroxide with Agilent 8900 ICP-QQQ
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| 2016 | Agilent Technologies
ICP/MS, ICP/MS/MS
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ICP/MS, ICP/MS/MS
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Agilent Technologies
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Semiconductor Analysis
Analyzing SiC/Co materials for radar absorption and EMI shielding using ARL X’TRA Companion XRD
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| 2025 | Thermo Fisher Scientific
XRD
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XRD
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Thermo Fisher Scientific
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Precision and Detail Ensured by Scanning Electron Microscopy
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| 2024 | ALS Europe (ALS Czech Republic)
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X-ray, Microscopy
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