Library | LabRulez ICPMS

EDXRF Analysis of Polymer Film

Applications

| N/A | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

Quantitative Analysis of Film Thicknesses of Multi-Layer Plating Used on Cards

Applications

| 2018 | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

Absolute Reflectance Measurement of Anti-Reflective Film for Solar Cells Using the SolidSpec-3700

Applications

| N/A | Shimadzu

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Shimadzu

Industries

Materials Testing

Introducing the EDXIR-Holder: Sample Holder/Stocker for Contaminant Measurement

Technical notes

| 2017 | Shimadzu

FTIR Spectroscopy, X-ray

Instrumentation

FTIR Spectroscopy, X-ray

Manufacturer

Shimadzu

Industries

Multilayer Film Analysis Using the AIMsight Infrared Microscope

Applications

| 2023 | Shimadzu

FTIR Spectroscopy, Microscopy

Instrumentation

FTIR Spectroscopy, Microscopy

Manufacturer

Shimadzu

Industries

Materials Testing

X-ray Fluorescence Analysis of Lead in Tin Plating Using Theoretical Intensity of Scattered X-rays - Analysis of RoHS Regulated Elements by Energy Dispersive X-ray Fluorescence Spectrometer (EDX)

Applications

| N/A | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

Quantitative Analysis of Fluorine by EDXRF: Powder and Fluorine-Containing Fil

Applications

| 2021 | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

UV-VIS Spectrophotometer UV-2600i UV-2700i

Brochures and specifications

| 2024 | Shimadzu

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Shimadzu

Industries

Others

Pass/Fail Judgment of Automotive Window Tint Film Using the Spectral Evaluation Function of LabSolutions™ UV-Vis Software

Applications

| 2019 | Shimadzu

Software, UV–VIS spectrophotometry

Instrumentation

Software, UV–VIS spectrophotometry

Manufacturer

Shimadzu

Industries

Materials Testing

Measurement of Transmittance Distribution Map of Sample Plane

Technical notes

| N/A | Shimadzu

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Shimadzu

Industries

EDXRF Analysis of Polymer Film

Quantitative Analysis of Film Thicknesses of Multi-Layer Plating Used on Cards

Absolute Reflectance Measurement of Anti-Reflective Film for Solar Cells Using the SolidSpec-3700

Introducing the EDXIR-Holder: Sample Holder/Stocker for Contaminant Measurement

Multilayer Film Analysis Using the AIMsight Infrared Microscope

X-ray Fluorescence Analysis of Lead in Tin Plating Using Theoretical Intensity of Scattered X-rays - Analysis of RoHS Regulated Elements by Energy Dispersive X-ray Fluorescence Spectrometer (EDX)

Quantitative Analysis of Fluorine by EDXRF: Powder and Fluorine-Containing Fil

UV-VIS Spectrophotometer UV-2600i UV-2700i

Pass/Fail Judgment of Automotive Window Tint Film Using the Spectral Evaluation Function of LabSolutions™ UV-Vis Software

Measurement of Transmittance Distribution Map of Sample Plane

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