Improved Lab Efficiency with the Agilent 18-Cell Changer Accessory
Technical notes
| 2024 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Others
Agilent OpenLab Data Management Solutions
Brochures and specifications
| 2019 | Agilent Technologies
Software
Instrumentation
Software
Manufacturer
Agilent Technologies
Industries
GC instrumentation and technology update
Presentations
| 2010 | Agilent Technologies
GC, GC/MSD, Sample Preparation, GC/SQ
Instrumentation
GC, GC/MSD, Sample Preparation, GC/SQ
Manufacturer
Agilent Technologies
Industries
Solutions for Accelerated Raw Materials Identification
Brochures and specifications
| 2021 | Agilent Technologies
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Agilent Technologies
Industries
Pharma & Biopharma
Film Holder Accessory
Brochures and specifications
| 2021 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
WCPS: Single-Cell and Bulk ICP-MS Investigation of Accumulation Patterns of Pt-based Drugs in Cisplatin–Sensitive and –Resistant Cell Models
Posters
| 2023 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Pharma & Biopharma, Clinical Research
ICP Expert Automation Software Pack
Others
| 2020 | Agilent Technologies
Software, ICP/OES
Instrumentation
Software, ICP/OES
Manufacturer
Agilent Technologies
Industries
8 x 6 Water-Thermostatted Multicell Holder Series II Accessory
Manuals
| 2012 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
WCPS: Ultratrace Analysis of Phosphorus, Boron and Other Impurities in Photovoltaic Silicon and Trichlorosilane by ICP-MS with High Energy Collision Cell
Posters
| 2011 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Automated Surface Analysis of Metal Contaminants in Silicon Wafers by Online VPD-ICP-MS/MS