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    Elemental and Particle Analysis of N-Methyl-2-Pyrrolidone (NMP) by ICP-MS/MS

    Applications
    | 2022 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    PFA Inert Kit Compatible with Agilent ICP-MS

    Technical notes
    | 2019 | Savillex
    Consumables, ICP/MS
    Instrumentation
    Consumables, ICP/MS
    Manufacturer
    Agilent Technologies, Savillex
    Industries

    Through-Container Identity Verification of Polysorbates 20, 40, 60, and 80 with the Agilent RapID Raman System

    Applications
    | 2018 | Agilent Technologies
    RAMAN Spectroscopy
    Instrumentation
    RAMAN Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    WCPS: Particle Analysis of Two High Purity Grades of N-Methyl-2- Pyrrolidone (NMP) using Single Particle (sp)ICP-MS/MS Method

    Posters
    | 2023 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Energy & Chemicals , Semiconductor Analysis

    Ultratrace Analysis of Solar (Photovoltaic) Grade Bulk Silicon by ICP-MS

    Applications
    | 2008 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ

    Applications
    | 2020 | Agilent Technologies
    GC, ICP/MS, Speciation analysis, ICP/MS/MS
    Instrumentation
    GC, ICP/MS, Speciation analysis, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Direct Analysis of Trace Metal Impurities in High Purity Nitric Acid Using ICP-QQQ

    Applications
    | 2018 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Analysis of steel and its alloys using the GB/T 20125-2006 standard and an Agilent 5100 ICP-OES in dual view mode

    Applications
    | 2015 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries
    Energy & Chemicals , Materials Testing

    Automated Analysis of Semiconductor Grade Hydrogen Peroxide and DI Water using ICP-QQQ

    Applications
    | 2018 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Determination of challenging elements in ultrapure semiconductor grade sulfuric acid by Triple Quadrupole ICP-MS

    Applications
    | 2015 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis
     

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