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Select your AA Hollow Cathode Lamp by Element
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| 2018 | Agilent Technologies
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Agilent Technologies
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Consumable Solutions for Semiconductor Analysis
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| 2025 | Agilent Technologies
ICP/MS/MS, ICP/MS
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Semiconductor Analysis
Determination of Elemental Impurities in Copper Sulfate using ICP-OES
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| 2023 | Agilent Technologies
ICP-OES
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Agilent Technologies
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Agilent Inorganic Certified Reference Materials and Standards
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| 2021 | Agilent Technologies
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Determination of Copper in Green Olives using ICP-OES
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| 2018 | Agilent Technologies
ICP-OES
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Agilent Technologies, CEM
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Determination of Trace Impurities in High-Purity Copper by Sequential ICP-OES with Axial Viewing
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| 2010 | Agilent Technologies
ICP-OES
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Agilent Technologies
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Nickel-Plated Sampler Cones Last Longer
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| 2019 | Agilent Technologies
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Agilent Technologies
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Direct Determination of As, Cu and Pb in Seawater by Zeeman Graphite Furnace Atomic Absorption Spectrometry
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| 2010 | Agilent Technologies
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Agilent Technologies
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Ultra-Trace Analysis of Metals in Mineral Reference Materials
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| 2021 | Agilent Technologies
GD/MP/ICP-AES
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Agilent Technologies
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Health Checks for Flame and Graphite Furnace AAS
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| 2021 | Agilent Technologies
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