Applications - page 1

Low reflectance measurements using the ‘VW’ technique

Technical notes

| 2011 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Characteristic Mass in Graphite Furnace Atomic Absorption Spectrometry

Technical notes

| 2019 | Agilent Technologies

AAS

Instrumentation

AAS

Manufacturer

Agilent Technologies

Industries

Agilent Cary Universal Measurement Accessory (UMA)

Technical notes

| 2013 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Nanoparticle Analysis by ICP-MS - Why sensitivity is key

Technical notes

| 2023 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Measuring baseline-corrected spectra on a Cary 60 UV-Vis

Technical notes

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Time-resolved Measurements Using the Agilent Cary Eclipse Fluorescence Spectrophotometer

Technical notes

| 2016 | Agilent Technologies

Fluorescence spectroscopy

Instrumentation

Fluorescence spectroscopy

Manufacturer

Agilent Technologies

Industries

Improving Spectral Quality Using Beam Collimation Control

Technical notes

| 2024 | Agilent Technologies

UV–VIS spectrophotometry, NIR Spectroscopy

Instrumentation

UV–VIS spectrophotometry, NIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing

Quality Control of Beam Splitters and Quarter-Wave-Mirrors

Technical notes

| 2020 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Pyrolytic Graphite Platforms – Guidelines for use with the GTA-95 Graphite Tube Atomizer

Technical notes

| 2010 | Agilent Technologies

AAS

Instrumentation

AAS

Manufacturer

Agilent Technologies

Industries

On-line isotope dilution analysis with the 7700 Series ICP-MS: Analysis of trace elements in high matrix samples

Technical notes

| 2011 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Environmental