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Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS
Applications
| 2003 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Superior ICP-OES optical design for unmatched speed and performance
Technical notes
| 2016 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Superior ICP-OES optical design for unmatched speed and performance
Technical notes
| 2014 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
True simultaneous ICP-OES for unmatched speed and performance
Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Agilent ICP-MS Interface Cones
Technical notes
| 2019 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
PFAS Testing: Is a Storm Brewing?
Technical notes
| 2025 | The Analytical Scientist (Agilent Technologies)
LC/MS/MS, LC/MS, LC/HRMS, IC-MS, GC/HRMS, GC/MS/MS, DART, NMR, X-ray, FTIR Spectroscopy
Instrumentation
LC/MS/MS, LC/MS, LC/HRMS, IC-MS, GC/HRMS, GC/MS/MS, DART, NMR, X-ray, FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Food & Agriculture, Environmental
Technical Overview and Performance Capability of the Agilent 7900s ICP-MS for Semiconductor Applications
Technical notes
| 2020 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Fast and Easy Measurement of Scattering Samples with the Agilent Cary 60 UV-Vis Spectrophotometer
Brochures and specifications
| 2025 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Environmental
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike