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Ultrapure Process Chemicals Analysis by ICP-QQQ with Hot Plasma Conditions
Applications
| 2021 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Ultra trace measurement of potassium and other elements in ultrapure water using the Agilent 8800 ICP-QQQ in cool plasma reaction cell mode
Applications
| 2014 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)
Applications
| 2001 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Innovative Freeform Optical Design Improves ICP-OES Speed and Analytical Performance
Technical notes
| 2023 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
RoHS/ELV Directives - Measurement of Heavy Metals Using ICP-MS
Applications
| 2006 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Nanoparticle Analysis by ICP-MS - Why sensitivity is key
Technical notes
| 2023 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Release Notes for Agilent ICP Expert Version 7.4.1
Manuals
| 2018 | Agilent Technologies
Software, ICP-OES
Instrumentation
Software, ICP-OES
Manufacturer
Agilent Technologies
Industries
MP-AES AUTOMATION SOFTWARE PACK
Others
| 2016 | Agilent Technologies
Software, GD/MP/ICP-AES
Instrumentation
Software, GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Other projects
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WebinarsAbout usContact usTerms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike