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Applications - page 16
ICP-OES Productivity Package
Technical notes
| 2013 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Measuring optical densities over 10 Abs on the Agilent Cary 7000 Universal Measurement Spectrophotometer (UMS)
Technical notes
| 2013 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Update to the UV-Visible ChemStation method for testing photometric accuracy in the ultraviolet region of the spectrum
Technical notes
| 2013 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Agilent 8800 Triple Quadrupole ICP-MS: Understanding oxygen reaction mode in ICP-MS/MS
Technical notes
| 2012 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
‘Fitted’ — Fast, accurate and fully- automated background correction
Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Dedicated axial or radial plasma view for superior speed and performance
Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
True simultaneous ICP-OES for unmatched speed and performance
Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
FACT spectral deconvolution
Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike