Analysis of Rare Earth Elements in Geological Samples by Laser Ablation - Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS)

Applications
| 2002 | Agilent Technologies
ICP/MS, Laser ablation
Instrumentation
ICP/MS, Laser ablation
Manufacturer
Agilent Technologies
Industries

Optimization of method conditions for high matrix samples using the Agilent 4210 MP‑AES

Technical notes
| 2016 | Agilent Technologies
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries

Analysis of Electroceramics by Laser Ablation ICP-MS

Applications
| 2004 | Agilent Technologies
ICP/MS, Laser ablation
Instrumentation
ICP/MS, Laser ablation
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Analysis of 15 nm Iron Nanoparticles in Organic Solvents by spICP-MS

Applications
| 2020 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

A Complete Method for Environmental Samples by Simultaneous Axially Viewed ICP- OES following US EPA Guidelines

Applications
| 2010 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Environmental

WCPS: Validating ICP-MS Using USP<232>/<233> for Elemental Impurity Analysis in Pharmaceutical Products

Posters
| 2012 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Pharma & Biopharma

Automated, unattended multi-angle transmission and absolute refl ection measurements on architectural and automotive glass using the Agilent Cary 7000 Universal Measurement Spectrophotometer (UMS)

Applications
| 2013 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing

Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

Applications
| 2001 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

On-line isotope dilution analysis with the 7700 Series ICP-MS: Analysis of trace elements in high matrix samples

Technical notes
| 2011 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental

Measurement of Diffuse Reflection from Catalyst Powders

Applications
| 2023 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Other projects
GCMS
LCMS
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