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    Applications from Agilent Technologies | LabRulez ICPMS

    Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ

    Applications
    | 2020 | Agilent Technologies
    GC, ICP/MS, Speciation analysis, ICP/MS/MS
    Instrumentation
    GC, ICP/MS, Speciation analysis, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Measuring Inorganic Impurities in Semiconductor Manufacturing

    Guides
    | 2022 | Agilent Technologies
    GC, ICP/MS, Speciation analysis, ICP/MS/MS
    Instrumentation
    GC, ICP/MS, Speciation analysis, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Agilent Cary 610/620 FTIR microscopes and imaging systems

    Brochures and specifications
    | 2014 | Agilent Technologies
    FTIR Spectroscopy, Microscopy
    Instrumentation
    FTIR Spectroscopy, Microscopy
    Manufacturer
    Agilent Technologies
    Industries

    Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

    Applications
    | 2020 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing, Semiconductor Analysis

    Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500

    Applications
    | 2011 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing, Semiconductor Analysis

    Measuring the Optical Properties of Photovoltaic Cells

    Applications
    | 2023 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ

    Applications
    | 2015 | Agilent Technologies
    GC, Speciation analysis, ICP/MS/MS
    Instrumentation
    GC, Speciation analysis, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Energy & Chemicals , Semiconductor Analysis

    Agilent 8700 LDIR Chemical Imaging System

    Brochures and specifications
    | 2019 | Agilent Technologies
    FTIR Spectroscopy
    Instrumentation
    FTIR Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries

    Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging

    Applications
    | 2014 | Agilent Technologies
    FTIR Spectroscopy
    Instrumentation
    FTIR Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing, Semiconductor Analysis

    Agilent ICP-MS Journal (February 2015 – Issue 60)

    Others
    | 2015 | Agilent Technologies
    GC, ICP/MS, Speciation analysis, ICP/MS/MS
    Instrumentation
    GC, ICP/MS, Speciation analysis, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Environmental, Energy & Chemicals
     

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