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Applications from Agilent Technologies | LabRulez ICPMS
SmartRinse — Maximizing throughput
Technical notes
| 2010 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
Superior ICP-OES optical design for unmatched speed and performance
Technical notes
| 2016 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
Superior ICP-OES optical design for unmatched speed and performance
Technical notes
| 2014 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
WCPS: Analysis of radioactive iodine-129 by ICP-QQQ using MS/MS mode and a new octopole reaction cell with axial acceleratio
Posters
| 2017 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental, Energy & Chemicals
Wavelength Calibration, Overranges & Zero Order Troubleshooting Hints For The 4100 MP-AES
Presentations
| 2012 | Agilent Technologies
MP/ICP-AES
Instrumentation
MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
APWC: Analysis of radioactive iodine-129 by ICP-QQQ using MS/MS mode and an octopole reaction cell with axial acceleration
Posters
| 2017 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Ultratrace measurement of calcium in ultrapure water using the Agilent 8800 Triple Quadrupole ICP-MS
Applications
| 2012 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Wide Dynamic Range Electron Multiplier Detector
Technical notes
| 2020 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
WCPS: Accurate determination of Eu, and Sm in ultra-pure barium carbonate materials by ICP-QQQ
Posters
| 2017 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
APWC: Interference-free Measurement of Trace Mercury in Tungsten-rich Cosmetic Sample using ICP-QQQ
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| 2017 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
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Agilent Technologies
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