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Transmission Measurements of Solid Samples at Variable Angles of Incidence by UV-Vis
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| 2024 | Agilent Technologies
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| 2021 | Agilent Technologies
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AGILENT VARIABLE ANGLE SPECULAR REFLECTANCE ACCESSORY (VASRA)
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Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements
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| 2020 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
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NIR Spectroscopy, UV–VIS spectrophotometry
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| 2019 | Agilent Technologies
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High Volume Optical Component Testing
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| 2020 | Agilent Technologies
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Measuring the Performance of Compact Visual Displays
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| 2021 | Agilent Technologies
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Spectrophotometric Spatial Profiling of Coated Optical Wafers
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| 2020 | Agilent Technologies
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| 2019 | Agilent Technologies
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Agilent Technologies
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Gaining Deeper Insights into Thin Film Response
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| 2022 | Agilent Technologies
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NIR Spectroscopy, UV–VIS spectrophotometry
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Agilent Technologies
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