Applications from Agilent Technologies - page 1

Optimizing Microplastic Characterization by LDIR: Automated versus Manual Workflows

Technical notes
| 2025 | Agilent Technologies
FTIR Spectroscopy, Particle size analysis
Instrumentation
FTIR Spectroscopy, Particle size analysis
Manufacturer
Agilent Technologies
Industries
Materials Testing

Introduction to Laser Ablation ICP-MS for the Analysis of Forensic Samples

Technical notes
| 2004 | Agilent Technologies
ICP/MS, Laser ablation
Instrumentation
ICP/MS, Laser ablation
Manufacturer
Agilent Technologies
Industries
Forensics

Unique Benefits of the Small Beam Geometry of the Agilent Cary 60 UV-Visible Spectrophotometer

Technical notes
| 2014 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries

Imaging - what is it and how is it implemented?

Technical notes
| 2011 | Agilent Technologies
FTIR Spectroscopy, Microscopy
Instrumentation
FTIR Spectroscopy, Microscopy
Manufacturer
Agilent Technologies
Industries

True simultaneous ICP-OES for unmatched speed and performance

Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries

Superior ICP-OES optical design for unmatched speed and performance

Technical notes
| 2016 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries

Synchronous Vertical Dual View (SVDV) for superior speed and performance

Technical notes
| 2016 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries

Superior ICP-OES optical design for unmatched speed and performance

Technical notes
| 2014 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries

Synchronous Vertical Dual View (SVDV) for superior speed and performance

Technical notes
| 2014 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries

Dedicated axial or radial plasma view for superior speed and performance

Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Other projects
GCMS
LCMS
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